Klaus von Klitzing, Nobel Laureate in Physics, 1985
Arkadiusz Mężyk, Rector of the Silesian University of Technology
| Chair: | Marian Kampik, Silesian University of Technology (SUT), Poland |
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| Co-chair: | Tadeusz Skubis, Director of the Publishing House PAK, a SIMP agenda |
| Co-chair: | Andrzej Bień, AGH University of Science and Technology, Poland |
| Conference secretary: | Krzysztof Musioł, SUT Artur Skórkowski, SUT |
| Communication: | Michał Grzenik, SUT |
| Webpage design & administration: |
Anna Piaskowy, SUT |
| Financial and event management: |
Agnieszka Skórkowska, SUT Anna Dąbrowska, PAK |
| Members: | Marcin Jachimski, AGH Ewa Kampik Krzysztof Kubiczek, SUT Maciej Malinowski, SUT Adam Pilśniak, SUT Aleksandra Rejman, SUT |
| Chair: | Waldemar Nawrocki, Poznań University of Technology (PUT), Poland |
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| Members: | Yasutaka Amagai, National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Tsukuba, Japan, Jerzy Augustyn, Kielce University of Technology, Kielce, Poland, Józef Barnaś, Adam Mickiewicz University, Poznan, Poland, Ralf Behr, Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany, Sam Benz, National Institute of Standards and Technology (NIST), Boulder, USA, Andrzej Bień, AGH University of Science and Technology, Poland, Jean-Paul Braun, Federal Institute of Metrology (METAS), Bern-Wabern, Switzerland, Luca Callegaro, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy, Stefan Cular, National Institute of Standards and Technology (NIST), Gaithersburg, USA, Albin Czubla, Central Office of Measures (GUM), Warsaw, Poland, Branislav Djokic, National Research Council (NRC), Ottawa, Canada, Edyta Dudek, Central Office of Measures (GUM), Warsaw, Poland, Paweł Fotowicz, Central Office of Measures (GUM), Warsaw, Poland, Ghislain Granger, National Research Council (NRC), Ottawa, Canada, Waldemar G. Kuerten Ihlenfeld, National Research Council (NRC), Ottawa, Canada, Damir Ilic, Primary Electromagnetic Laboratory (HMI/FER-PEL), Zagreb, Croatia, Blaise Jeanneret, Federal Institute of Metrology (METAS), Bern-Wabern, Switzerland, Marian Kampik, Silesian University of Technology (SUT), Poland, Nobu-Hisa Kaneko, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan, Oliver Kieler, Physikalisch-Technische Bundesanstalt, Braunschweig, Germany, Johannes Kohlmann, Physikalisch-Technische Bundesanstalt, Braunschweig, Germany, Krystian Krawczyk, Wroclaw University of Science and Technology, Wroclaw, Poland, Jan Kucera, Czech Metrology Institute (CMI), Prague, Czech Republic, Gregory Kyriazis, Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, Brazil, Hector Laiz, Instituto Nacional de Tecnología Industrial (INTI), Argentina, Rado Lapuh, Metrology Institute of the Republic of Slovenia (MIRS), Ljubljana, Slovenia, Michał Lisowski, Wroclaw University of Science and Technology, Wroclaw, Poland, Massimo Ortolano, Politecnico di Torino, Turin, Italy, Lutfi Ozyuzer, Izmir Institute of Technology, Izmir, Turkey, Ekkehard Peik, Physikalisch-Technische Bundesanstalt, Braunschweig, Germany, Francois Piquemal, Laboratoire National de métrologie et d’Essais (LNE), Trappes, France, Ryszard Rybski, University of Zielona Gora, Poland, Hansjörg Scherer, Physikalisch-Technische Bundesanstalt, Braunschweig, Germany, Paul Seidel, Friedrich Schiller Universität, Jena, Germany, Tadeusz Skubis, Silesian University of Technology, Gliwice, Poland, Andrea Sosso, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy, Mariusz Stępień, Silesian University of Technology, Gliwice, Poland, Tadeusz Szumiata, Central Office of Measures (GUM), Warsaw, Poland, Jerzy Szutkowski, Central Office of Measures (GUM), Warsaw, Poland, Olivier Thevenot, Laboratoire National de métrologie et d’Essais (LNE), Trappes, France, Andrzej Zięba, AGH University of Science and Technology, Krakow, Poland. |
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